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Technology

Specifications

Process node, operating conditions, crypto throughput, interfaces, package, and power — the engineering numbers for Bastionchip HSM silicon.

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Full Specification Table

BC1-HSM silicon — preliminary datasheet

Pre-production specifications for the Bastionchip BC1-HSM discrete security element. Values reflect first-silicon target; subject to characterization update. Full production datasheet available under NDA.

Process & Die
Process node28 nm FD-SOITSMC N28FDS
Die area~12 mm²Preliminary estimate
Transistor count~280 MPreliminary estimate
Package64-pin QFP (9×9 mm), 144-ball BGA (10×10 mm)Two package options
Power
Core supply1.0 V ±5%FD-SOI 28 nm core rail
I/O supply1.8 V / 3.3 V (selectable)I/O ring voltage
Active power (full AES load)<250 mWTarget at TJ = 25°C
Standby power (mesh armed)<5 μWKeys retained, mesh active
Zeroize power spike<10 mW / 2 nsEnergy = <20 pJ
Temperature
Commercial grade0°C to +70°C (Tj)Standard commercial
Industrial grade−40°C to +85°C (Tj)Defense / embedded OEM
Storage temperature−55°C to +125°C
Crypto Engine Throughput
AES-256-GCM10 GbpsDedicated hardware pipeline
AES-256-CBC / CTR12 GbpsNo authentication overhead
SHA-3-2566 GbpsKeccak hardware core
SHA-3-5123 Gbps
HMAC-SHA2568 GbpsSHA-256 + HMAC wrapper
ECDSA P-384 sign~2,400 ops/sHardware scalar multiplier
ECDSA P-384 verify~4,800 ops/s
Kyber-768 encapsulate~8,000 ops/sCRYSTALS-Kyber hardware
Kyber-768 decapsulate~7,500 ops/s
Dilithium-3 sign~3,000 ops/sCRYSTALS-Dilithium hardware
True RNG (NIST SP 800-90B)800 MbpsRing oscillator entropy source
Key Storage
Hardware-protected key slots128 slots256-bit each; AES or ECC
PUF root key256 bitsDerived, never stored
NVM key backupAES-256 wrapped by PUF keyOn-die NVM; encrypted at rest
Key wrappingAES-256 key wrap (RFC 3394)For export to host under NDA
Physical Security
Tamper mesh layer count3 active metal layersAll over sensitive logic
Tamper detection response<1 nsZeroize signal latency
Voltage glitch detection±5% from nominalPer-rail monitor
Clock glitch detectionFrequency deviation >15%PLL-based monitor
Temperature sensorAlerts below −40°C / above +100°COn-die thermal monitor
Host Interfaces
PCIeGen 4 × 4 (16 GT/s)Native endpoint; UEFI driver support
SPIUp to 50 MHz; SPI Mode 0/3Embedded / low-speed host
I²CFast-mode Plus (1 MHz)Management / config channel
USB 2.0Full-speed / Hi-speed deviceOptional; evaluation kit
GPIO / IRQ8 bidirectional; 2 IRQ outputsTamper alert + status
Certification Targets
FIPS 140-3Level 3 (target)Submission planned post-first-silicon characterization
Common CriteriaEAL 4+ (target)Protection profile: PP-MODULE for HSM
PCI-HSMv3.0 design alignmentNot yet submitted

All specifications are preliminary design targets. Actual performance verified post-silicon characterization. Certification statuses are targets — no current certifications claimed.

Ordering Guide

Evaluation program and part numbers

BC1-HSM-EVK
Evaluation Kit

PCIe evaluation board, 1× BC1-HSM silicon sample, test vector package, driver source, and preliminary architecture documentation. NDA required.

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BC1-HSM-C / BC1-HSM-I
Production Part

BC1-HSM-C (commercial temp, QFP-64) and BC1-HSM-I (industrial temp, BGA-144). Minimum order and pricing via design-win program.

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BC1-HSM-NDA
NDA Datasheet

Full production datasheet, register map, tamper characterization data, and side-channel test report. Available under mutual NDA to qualified design partners.

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Evaluation kits available for qualified cloud, financial services, and defense design partners. NDA required for full datasheet.